DocumentCode
2149627
Title
The Reliability of Software Algorithms and Software-Based Mitigation Techniques in Digital Signal Processors
Author
Quinn, Heather ; Fairbanks, Tom ; Tripp, Justin L. ; Manuzzato, Andrea
Author_Institution
Los Alamos Nat. Lab., Los Alamos, NM, USA
fYear
2013
fDate
8-12 July 2013
Firstpage
1
Lastpage
8
Abstract
Digital signal processors (DSP) are microprocessor- like processing elements that are specifically designed for signal and image processing algorithms. DSPs share many of the same failure mechanisms as microprocessors, including component crashes, program crashes and silent data corruption (SDC). The root of these problems is often single- event upsets (SEUs) in caches or control circuitry. In testing we have found DSPs are very sensitive to SDC, where computationally incorrect output data is produced but program execution is not affected. SDC can be problematic as it is hard to detect and could lead to the corruption of on-orbit data. We found that SDC could be reduced through the use of triple modular redundancy. In this paper we present data on how software on DSPs is susceptible to radiation-induced upsets and software techniques for reducing SDC.
Keywords
digital signal processing chips; reliability; DSP; SDC; SEU; component crashes; digital signal processor; failure mechanism; microprocessor-like processing element; program crashes; radiation-induced upset; silent data corruption; single-event upset; software algorithm reliability; software-based mitigation technique; triple modular redundancy; Digital signal processing; Microprocessors; Software; Software reliability; Timing; Universal Serial Bus;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation Effects Data Workshop (REDW), 2013 IEEE
Conference_Location
San Francisco, CA
ISSN
2154-0519
Print_ISBN
978-1-4799-1136-3
Type
conf
DOI
10.1109/REDW.2013.6658218
Filename
6658218
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