DocumentCode
2150406
Title
Modeling and identification of structure defects in dielectric diodes
Author
Nyi, V. M Bogomol
Author_Institution
Moscow State Univ. of Service, Moscow Region, Russia
Volume
3
fYear
2003
fDate
20-22 Aug. 2003
Firstpage
920
Abstract
On electrode surface near of the micropeak tip the high electrical field strength, mechanical stresses concentration and local temperature increase arose. "Lighting-conduction" effect arose therefore. Theory of the first reversible stage of electrical degradation MDM structure formulated on base of analogy in mathematical description of electron transport and hydrodynamic flow.
Keywords
MIM devices; current fluctuations; dielectric relaxation; electric strength; semiconductor diodes; MDM structure; bifurcation point; current oscillations; dielectric diodes; dielectric relaxation; electrical degradation; electrode surface; first reversible stage; high electrical field strength; hydrodynamic flow; lighting-conduction effect; local temperature increase; mechanical stresses; micropeak tip; structure defects; Cathodes; Conductivity; Dielectrics; Diodes; Electrodes; Electron emission; Equations; Frequency; Permittivity; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Physics and Control, 2003. Proceedings. 2003 International Conference
Print_ISBN
0-7803-7939-X
Type
conf
DOI
10.1109/PHYCON.2003.1237026
Filename
1237026
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