• DocumentCode
    2150574
  • Title

    Cell-based high-frequency IC design in scaled CMOS

  • Author

    Yue, C. Patrick ; Shin, Dong Hun

  • Author_Institution
    ECE Dept., Carnegie Mellon Univ., Pittsburgh, PA, USA
  • fYear
    2008
  • fDate
    20-23 Oct. 2008
  • Firstpage
    1452
  • Lastpage
    1455
  • Abstract
    This paper presents a cell-based modeling and design platform for high-frequency analog ICs to shorten design cycle time and to minimize the risk for mask re-spin. Based on a pre-characterized analog sub-circuit cell library, which contains not only active devices and passive components but also routing interconnects. This methodology systematically alleviates modeling inaccuracy at high frequencies due to the difference in the layout between device test structures and actual circuit implementation. By exploiting the modularity in analog circuits at the sub-circuit level, the proposed design platform achieves a balance between design flexibility and modeling accuracy compared. The macro modeling techniques the sub-circuit cells will be described along with measurement results from a characterization test chip.
  • Keywords
    CMOS analogue integrated circuits; integrated circuit design; integrated circuit interconnections; integrated circuit measurement; integrated circuit modelling; network routing; cell-based high-frequency IC design; design flexibility; high-frequency analog integrated circuit; macro modeling techniques; mask re-spin; precharacterized analog subcircuit cell library; routing interconnect; scaled CMOS; test chip characterization; Analog circuits; CMOS integrated circuits; Circuit testing; Frequency; Integrated circuit interconnections; Libraries; Routing; Semiconductor device measurement; Semiconductor device modeling; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated-Circuit Technology, 2008. ICSICT 2008. 9th International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-2185-5
  • Electronic_ISBN
    978-1-4244-2186-2
  • Type

    conf

  • DOI
    10.1109/ICSICT.2008.4734837
  • Filename
    4734837