Microcavity effects on spontaneous emission factor in 1.55μm VCSELs

Author

Ramoo, Desi M. ; Adams, Michael J.

Author_Institution

Dept. of Electron. Syst. Eng., Essex Univ., Colchester, UK

fYear

2002

fDate

2002

Abstract

The ratio of spontaneous emission in the resonant mode of a laser to the total spontaneous emission is commonly known as the spontaneous emission factor. This factor is used in the rate equation analysis to characterise the spectral and dynamic behaviour of semiconductor lasers. In this present study, we combine the material temperature effects with temperature dependent cavity effects.

Keywords

carrier density; infrared sources; laser transitions; microcavity lasers; semiconductor lasers; spontaneous emission; surface emitting lasers; thermo-optical effects; 1.55 micron; 1.55μm VCSELs; dynamic behaviour; material temperature effects; microcavity effects; rate equation analysis; resonant laser mode; semiconductor lasers; spectral behaviour; spontaneous emission factor; temperature dependent cavity effect; Equations; Laser modes; Microcavities; Optical materials; Resonance; Semiconductor lasers; Semiconductor materials; Spontaneous emission; Temperature dependence; Vertical cavity surface emitting lasers;

fLanguage

English

Publisher

ieee

Conference_Titel

All-Optical Networking: Existing and Emerging Architecture and Applications/Dynamic Enablers of Next-Generation Optical Communications Systems/Fast Optical Processing in Optical Transmission/VCSEL and

ISSN

1099-4742

Print_ISBN

0-7803-7378-2

Type

conf

DOI

10.1109/LEOSST.2002.1027625

Filename

1027625