Statistical design characterization of analog circuits

Analog designs typically employ multiple core building block circuits, including current mirrors, band gap references, differential pairs and op amps, which require precisely matched performance between multiple devices. However, due to the statistical nature of the fabrication process, there will always be slight differences between these critical devices, contributing towards increased variation in circuit performance. Understanding the impact and potential interactions of variations between these matched devices may be critical in producing a commercially viable product. Following a brief overview of the nature of statistical process variation, we will demonstrate how to systematically evaluate components of a band gap circuit to isolate matching sensitivities and refine the sizings for optimized results.