• DocumentCode
    2153607
  • Title

    A fast-locking phase-locked loop using a seven-state phase frequency detector

  • Author

    Liu, Silin ; Hao, Zhikun ; Heping ma ; Yuan, Ling ; Shi, Yin

  • Author_Institution
    Inst. of Semicond., Chinese Acad. of Sci., Beijing, China
  • fYear
    2008
  • fDate
    20-23 Oct. 2008
  • Firstpage
    2004
  • Lastpage
    2007
  • Abstract
    A seven-state phase frequency detector (S.S PFD) is proposed for fast-locking charge pump based phase-locked loops (CPPLLs) in this paper. The locking time of the PLL can be significantly reduced by using the seven-state PFD to inject more current into the loop filter. In this stage, the bandwidth of the PLL is increased or decreased to track the phase difference of the reference signal and the feedback signal. The proposed architecture is realized in a standard 0.35 ¿m 2P4 M CMOS process with a 3.3 V supply voltage. The locking time of the proposed PLL is 1.102 ¿s compared with the 2.347 ¿s of the PLL based on continuous-time PFD and the 3.298 ¿s of the PLL based on the pass-transistor tri-state PFD. There are 53.05% and 66.59% reductions of the locking time. The simulation results and the comparison with other PLLs demonstrate that the proposed seven-state PFD is effective to reduce locking time.
  • Keywords
    CMOS integrated circuits; charge pump circuits; phase detectors; phase locked loops; CMOS process; charge pump based PLL; continuous-time PFD; fast-locking phase-locked loop; feedback signal; loop filter; reference signal; seven-state phase frequency detector; size 0.35 mum; time 1.102 mus; voltage 3.3 V; Bandwidth; Charge pumps; Clocks; Feedback; Filters; Phase frequency detector; Phase locked loops; RNA; Signal generators; Voltage-controlled oscillators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated-Circuit Technology, 2008. ICSICT 2008. 9th International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-2185-5
  • Electronic_ISBN
    978-1-4244-2186-2
  • Type

    conf

  • DOI
    10.1109/ICSICT.2008.4734957
  • Filename
    4734957