• DocumentCode
    2155473
  • Title

    Short channel effects in submicron self-aligned gate heterostructure field effect transistors

  • Author

    Han, C.J. ; Ruden, P.P. ; Grider, D. ; Fraasch, A. ; Newstrom, K. ; Joslyn, P. ; Shur, M.

  • Author_Institution
    Honeywell Sensors & Signal Process. Lab., Bloomington, MN, USA
  • fYear
    1988
  • fDate
    11-14 Dec. 1988
  • Firstpage
    696
  • Lastpage
    699
  • Abstract
    AlGaAs/GaAs self-aligned gate heterostructure FETs with gate lengths varying from 0.3 to 1.5 mu m were fabricated to study short-channel effects. Peak extrinsic transconductance as high as 360 mS/mm was achieved with this process. Short-channel effects such as increases in the output conductance, increases in the subthreshold current, and shifts in the threshold voltage are reported for temperatures ranging from 30 degrees C to 100 degrees C. The observations follow closely predictions from a simple model which attributes the effects to space-charge-limited electron injection into the GaAs buffer layer beneath the actual two-dimensional electron gas channel.<>
  • Keywords
    III-V semiconductors; aluminium compounds; gallium arsenide; high electron mobility transistors; semiconductor device models; 0.3 to 1.5 micron; 30 to 100 C; 360 mS/mm; AlGaAs-GaAs; GaAs buffer layer; HEMTs; MODFETs; extrinsic transconductance; gate lengths; heterostructure FETs; model; output conductance; self-aligned gate heterostructure field effect transistors; semiconductors; short-channel effects; space-charge-limited electron injection; submicron; subthreshold current; temperatures; two-dimensional electron gas channel; Buffer layers; Electrons; Gallium arsenide; HEMTs; MODFETs; Predictive models; Subthreshold current; Temperature distribution; Threshold voltage; Transconductance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1988. IEDM '88. Technical Digest., International
  • Conference_Location
    San Francisco, CA, USA
  • ISSN
    0163-1918
  • Type

    conf

  • DOI
    10.1109/IEDM.1988.32908
  • Filename
    32908