• DocumentCode
    2156058
  • Title

    Polycide/metal capacitors for high precision A/D converters

  • Author

    Kaya, C. ; Tigelaar, H. ; Paterson, J. ; de Wit, M. ; Fattaruso, J. ; Hester, D. ; Kiriakai, S. ; Tan, K.-S. ; Tsay, F.

  • Author_Institution
    Texas Instrum., Dallas, TX, USA
  • fYear
    1988
  • fDate
    11-14 Dec. 1988
  • Firstpage
    782
  • Lastpage
    785
  • Abstract
    The authors present a novel metal-to-silicide-polysilicon capacitor and compare it with metal-to-polysilicon capacitors and conventional polysilicon-to-polysilicon capacitors. Voltage coefficient data for these capacitor structures with oxide, oxide/nitride, oxide/nitride/oxide, and nitride dielectrics are also discussed. It is shown that when metal-to-silicided polysilicon capacitors are used, voltage coefficients of less than 4 p.p.m./V can be attained, which is considerably less than that obtained when metal-to-poly or conventional poly-to-poly capacitors are used. For high-precision A/D converters, this value will make possible accuracies of up to 18 bits through self-calibration.<>
  • Keywords
    analogue-digital conversion; capacitors; integrated circuit technology; A/D converters; high precision ADC; metal/silicide/poly-Si capacitor; nitride dielectrics; oxide dielectric; oxide/nitride dielectric; oxide/nitride/oxide dielectric; polycide/metal capacitors; polycrystalline Si; self-calibration; voltage coefficients; Annealing; Capacitance; Capacitors; Costs; Dielectric materials; Fabrication; Instruments; Low voltage; Process design; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1988. IEDM '88. Technical Digest., International
  • Conference_Location
    San Francisco, CA, USA
  • ISSN
    0163-1918
  • Type

    conf

  • DOI
    10.1109/IEDM.1988.32928
  • Filename
    32928