• DocumentCode
    2156213
  • Title

    Maximizing THz amplitude for improved pulse parameters and high power applications

  • Author

    Ibrahim, Omar A. ; Ray, Sampad ; Alla, Arun ; Al Saif, Haitham ; Kirawanich, Phumin ; Islam, Naz E. ; Sharma, Ashwani ; Bayberry, Clay

  • Author_Institution
    ECE Dept., Univ. of Missouri-Columbia, Columbia, MO, USA
  • fYear
    2012
  • fDate
    8-14 July 2012
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    A THz generating, low temperature grown semi-Insulating Gallium Arsenide photo conductive semiconductor switch was analyzed for optimum pulse amplitude for high power applications. The switching voltage which controls the substrate conditions for the given geometry was determined by monitoring the conditions in the trap-filled substrate region of the switch during the charging state. Trap occupancy, current flow lines, and the electric field were the major parameters monitored. The switch was illuminated for 350 fs with a 0.78 μm beam, and a power density of 50 Mw/cm2. Results show that the switch produces a central frequency of 1.75 Terahertz, with a pulse amplitude of approximately 0.22 A at an optimum bias voltage of 1100 Volts. The FWHM of the generated pulse 0.4 ps, and the rise time is 0.275 ps.
  • Keywords
    III-V semiconductors; condition monitoring; gallium arsenide; photoconducting switches; semiconductor growth; terahertz wave devices; FWHM; GaAs; condition monitoring; current flow lines; electric field; frequency 1.75 THz; improved pulse parameters; low temperature grown gallium arsenide photoconductive semiconductor switch; optimum pulse amplitude; switching voltage; terahertz amplitude maximization; time 0.275 ps; time 0.4 ps; time 350 fs; trap occupancy; trap-filled substrate region; voltage 1100 V; Electron traps; Gallium arsenide; Signal to noise ratio; Substrates; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium (APSURSI), 2012 IEEE
  • Conference_Location
    Chicago, IL
  • ISSN
    1522-3965
  • Print_ISBN
    978-1-4673-0461-0
  • Type

    conf

  • DOI
    10.1109/APS.2012.6349126
  • Filename
    6349126