DocumentCode
2157862
Title
Diagnosing resistive bridges using adaptive techniques
Author
Ghosh-Dastidar, Jayabrata ; Touba, Nur A.
Author_Institution
Comput. Eng. Res. Center, Texas Univ., Austin, TX, USA
fYear
2000
fDate
2000
Firstpage
79
Lastpage
82
Abstract
A systematic procedure for locating resistive bridges is presented. Critical path tracing is used to identify a set of “suspect” bridges whose presence could explain all of the observed faulty behavior of the circuit for the original test set. The set of suspects is then reduced by adaptively applying additional tests derived from the failing vector pairs in the original test set. Unlike other approaches, the approach presented here is not based on any bridge fault modeling and does not require any fault simulation
Keywords
automatic testing; fault diagnosis; integrated circuit testing; logic testing; adaptive techniques; critical path tracing; failing vector pairs; resistive bridges; systematic procedure; test set; Bridge circuits; Circuit faults; Circuit simulation; Circuit testing; Delay; Dictionaries; Fault diagnosis; Logic devices; Logic gates; Threshold voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Custom Integrated Circuits Conference, 2000. CICC. Proceedings of the IEEE 2000
Conference_Location
Orlando, FL
Print_ISBN
0-7803-5809-0
Type
conf
DOI
10.1109/CICC.2000.852622
Filename
852622
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