• DocumentCode
    2159857
  • Title

    Proceedings 1994 IEEE International Conference on Computer Design: VLSI in Computers and Processors

  • fYear
    1994
  • fDate
    10-12 Oct. 1994
  • Abstract
    The following topics were dealt with: memory architecture; parallel processing and fault tolerance; synthesis for testability; formal representation; concurrent error detection; instruction scheduling; timing analysis; field programmable systems; microprocessor architectures; asynchronous circuit design; state based formal verification; sequential logic synthesis; computer-aided embedded system design; BIST/testability analysis; superscalar processor performance; test generation; asynchronous circuit synthesis; applications of formal methods; software testing; production logic synthesis; special purpose VLSI; interconnect analysis; MCM applications; and CMOS circuit techniques
  • Keywords
    VLSI; circuit CAD; logic CAD; logic design; logic testing; BIST; CMOS; MCM applications; asynchronous circuit design; asynchronous circuit synthesis; concurrent error detection; embedded system design; fault tolerance; field programmable systems; formal methods; formal representation; formal verification; instruction scheduling; interconnect analysis; memory architecture; microprocessor architectures; parallel processing; production logic synthesis; sequential logic; software testing; special purpose VLSI; superscalar processor performance; test generation; testability; timing analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Design: VLSI in Computers and Processors, 1994. ICCD '94. Proceedings., IEEE International Conference on
  • Conference_Location
    Cambridge, MA, USA
  • Print_ISBN
    0-8186-6565-3
  • Type

    conf

  • DOI
    10.1109/ICCD.1994.331835
  • Filename
    331835