DocumentCode
2163089
Title
On-chip picosecond time measurement
Author
Gutnik, V. ; Chandrakasan, A.
Author_Institution
MIT, Cambridge, MA, USA
fYear
2000
fDate
15-17 June 2000
Firstpage
52
Lastpage
53
Abstract
A flash Time to Digital Converter (TDC) can be calibrated to a precision on the order of the arbiter aperature without precise input signals. A theoretical result useful for calibration of a noise-limited arbiter array is derived, and verified empirically. A test chip with 64 arbiters in a 0.35 /spl mu/m CMOS process shows temporal resolution better than 2 picoseconds.
Keywords
Analog-digital conversion; CMOS integrated circuits; Calibration; Integrated circuit measurement; Time measurement; Timing circuits; Timing jitter; 0.35 micron; 2 ps; CMOS process; calibration; flash time to digital converter; jitter measurement; noise-limited arbiter array; on-chip picosecond time measurement; Calibration; Clocks; Delay; Frequency; Jitter; Sampling methods; Semiconductor device measurement; Signal resolution; Testing; Time measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Circuits, 2000. Digest of Technical Papers. 2000 Symposium on
Conference_Location
Honolulu, HI, USA
Print_ISBN
0-7803-6309-4
Type
conf
DOI
10.1109/VLSIC.2000.852849
Filename
852849
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