• DocumentCode
    2164019
  • Title

    Glass reflow process for an electrical isolation and temporary support of two-dimensional microscanner

  • Author

    Minyoung Yun ; Daehun Jeong ; Seunghwan Moon ; Jong-Hyun Lee

  • Author_Institution
    Gwangju Inst. of Sci. & Technol., Gwangju, South Korea
  • fYear
    2013
  • fDate
    18-22 Aug. 2013
  • Firstpage
    111
  • Lastpage
    112
  • Abstract
    In a two-dimensional (2-D) electrostatic microscanner, electrical isolation for separating the current paths of the 2-D actuator and temporary support for enhancing the reliability of the scanner fabrication are still major issues. In this paper, a glass reflow process was proposed to achieve both electrical isolation and temporary support. The glass was successfully reflowed into the silicon trenches with various widths (15 μm, 25 μm and 35 μm) and lengths (25 μm, 50 μm and 100 μm), which will be also evaluated in terms of breakdown voltage and fabrication yield.
  • Keywords
    elemental semiconductors; micro-optics; optical fabrication; reliability; silicon; 2D actuator; Si; breakdown voltage; electrical isolation; glass reflow process; reliability; scanner fabrication; silicon trenches; size 15 mum to 100 mum; temporary support; two-dimensional electrostatic microscanner; Biomedical optical imaging; Filling; Glass; Optical device fabrication; Optical imaging; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Optical MEMS and Nanophotonics (OMN), 2013 International Conference on
  • Conference_Location
    Kanazawa
  • ISSN
    2160-5033
  • Print_ISBN
    978-1-4799-1512-5
  • Type

    conf

  • DOI
    10.1109/OMN.2013.6659084
  • Filename
    6659084