DocumentCode
2164019
Title
Glass reflow process for an electrical isolation and temporary support of two-dimensional microscanner
Author
Minyoung Yun ; Daehun Jeong ; Seunghwan Moon ; Jong-Hyun Lee
Author_Institution
Gwangju Inst. of Sci. & Technol., Gwangju, South Korea
fYear
2013
fDate
18-22 Aug. 2013
Firstpage
111
Lastpage
112
Abstract
In a two-dimensional (2-D) electrostatic microscanner, electrical isolation for separating the current paths of the 2-D actuator and temporary support for enhancing the reliability of the scanner fabrication are still major issues. In this paper, a glass reflow process was proposed to achieve both electrical isolation and temporary support. The glass was successfully reflowed into the silicon trenches with various widths (15 μm, 25 μm and 35 μm) and lengths (25 μm, 50 μm and 100 μm), which will be also evaluated in terms of breakdown voltage and fabrication yield.
Keywords
elemental semiconductors; micro-optics; optical fabrication; reliability; silicon; 2D actuator; Si; breakdown voltage; electrical isolation; glass reflow process; reliability; scanner fabrication; silicon trenches; size 15 mum to 100 mum; temporary support; two-dimensional electrostatic microscanner; Biomedical optical imaging; Filling; Glass; Optical device fabrication; Optical imaging; Silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
Optical MEMS and Nanophotonics (OMN), 2013 International Conference on
Conference_Location
Kanazawa
ISSN
2160-5033
Print_ISBN
978-1-4799-1512-5
Type
conf
DOI
10.1109/OMN.2013.6659084
Filename
6659084
Link To Document