Improving the testability of mixed-signal integrated circuits

Author

Roberts, Gordon W.

Author_Institution

Lab. of Microelectron. & Comput. Syst., McGill Univ., Montreal, Que., Canada

fYear

1997

fDate

5-8 May 1997

Firstpage

214

Lastpage

221

Abstract

The author presents a discussion on several methods that can be used to improve the testability of mixed-signal integrated circuits. He begins by outlining the role of test, and its impact on product cost and qualify. A brief look is taken at the pending test crises for mixed-signal circuits. Subsequently, the author outlines several common test strategies, and their corresponding test setups for verifying the function of the analog portion of a mixed-signal circuit. In the remainder of the paper he describes several analog test buses and circuits for built-in self-test applications

Keywords

automatic testing; boundary scan testing; built-in self test; integrated circuit testing; mixed analogue-digital integrated circuits; BIST applications; analog test buses; built-in self-test; mixed-signal integrated circuits; test setups; test strategies; testability improvement; Automatic testing; Circuit testing; Consumer electronics; Costs; Electronic equipment testing; Integrated circuit testing; Microelectronics; Mixed analog digital integrated circuits; Packaging; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Custom Integrated Circuits Conference, 1997., Proceedings of the IEEE 1997

Conference_Location

Santa Clara, CA

Print_ISBN

0-7803-3669-0

Type

conf

DOI

10.1109/CICC.1997.606616

Filename

606616