• DocumentCode
    2164528
  • Title

    Polarization-independent photodetector with ring-type grating

  • Author

    Takeda, Akiko ; Aihara, Takuma ; Fukuhara, Masashi ; Ishii, Y. ; Fukuda, Motohisa

  • Author_Institution
    Toyohashi Univ. of Technol., Toyohashi, Japan
  • fYear
    2013
  • fDate
    18-22 Aug. 2013
  • Firstpage
    147
  • Lastpage
    148
  • Abstract
    We propose a polarization-independent Au/Si Schottky-type photodetector with a ring-type grating that excites surface plasmon polaritons. The electromagnetic fields in ring-type and rectangular-type grating structures are calculated using the finite-difference time-domain method. For samples with the two geometries (slit width of 100 nm, slit pitch of 440 nm, and Au film thickness of 300 nm), the polarization dependence of the photocurrent is measured and compared. We confirm that the ring-type grating photodetector has a polarization-independent photocurrent, whereas the rectangular-type grating photodetector has only higher sensitivity at specific polarization angles.
  • Keywords
    diffraction gratings; elemental semiconductors; finite difference time-domain analysis; gold; metallic thin films; photodetectors; polaritons; silicon; surface plasmons; Au-Si; electromagnetic fields; finite-difference time-domain method; gold film thickness; polarization-independent Schottky-type photodetector; polarization-independent photocurrent; rectangular-type grating structure; ring-type grating structure; size 100 nm; size 300 nm; surface plasmon polaritons; wavelength 440 nm; Films; Gold; Gratings; Photoconductivity; Photodetectors; Plasmons; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Optical MEMS and Nanophotonics (OMN), 2013 International Conference on
  • Conference_Location
    Kanazawa
  • ISSN
    2160-5033
  • Print_ISBN
    978-1-4799-1512-5
  • Type

    conf

  • DOI
    10.1109/OMN.2013.6659102
  • Filename
    6659102