DocumentCode
2166798
Title
Simulation of PIN diode under electromagnetic pulse based on decision tree
Author
Xiang, Kai ; Du, Zhengwei
Author_Institution
Dept. of Electron. Eng., Tsinghua Univ., Beijing
fYear
2008
fDate
2-5 Nov. 2008
Firstpage
1438
Lastpage
1441
Abstract
The electromagnetic pulse probably disturbs the normal operation of the PIN diode temporarily, or even damages the PIN diode permanently. Unlike just studying a certain aspect on the impact of the PIN diode in the other papers, the approach of decision trees is adopted to reveal the relationship between the extent of the PIN diode damage and the parameters (the rise time, width, and voltage) of electromagnetic pulse in an all-round manner. Besides, using decision tree to classify the degree of the PIN diode damage can save simulation time.
Keywords
decision trees; electromagnetic pulse; p-i-n diodes; PIN diode; decision tree; electromagnetic pulse; rise time; voltage; Charge carrier processes; Decision trees; EMP radiation effects; Electromagnetic transients; Electronic equipment; Numerical models; Poisson equations; Temperature; Thermal conductivity; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas, Propagation and EM Theory, 2008. ISAPE 2008. 8th International Symposium on
Conference_Location
Kunming
Print_ISBN
978-1-4244-2192-3
Electronic_ISBN
978-1-4244-2193-0
Type
conf
DOI
10.1109/ISAPE.2008.4735500
Filename
4735500
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