Minimizing noise in analog bipolar circuit design

Author

Bowers, Derek F.

Author_Institution

Precision Monolithics Inc., Santa Clara, CA, USA

fYear

1989

fDate

18-19 Sep 1989

Firstpage

107

Lastpage

111

Abstract

A summary of noise phenomena is presented, covering thermal (Johnson), shot (Schottky), flicker (1/f), burst (popcorn), voltage and current noise. Low-noise design techniques for bipolar transistor circuits are discussed, and pitfalls to be avoided are described. It is noted that the bipolar transistor has a fairly predictable noise characteristic compared to a MOSFET or JFET. However, careful attention to geometry, operating currents, and loading effects is necessary to produce a circuit optimized for overall noise performance

Keywords

analogue circuits; bipolar integrated circuits; bipolar transistor circuits; electron device noise; linear integrated circuits; random noise; thermal noise; 1/f noise; Johnson noise; Schottky noise; analog bipolar circuit design; burst noise; current noise; flicker noise; loading effects; low noise design techniques; noise minimisation; noise phenomena; operating currents; popcorn noise; shot noise; thermal noise; voltage noise; 1f noise; Bipolar transistors; Circuit noise; Circuit synthesis; Integrated circuit noise; Low-frequency noise; Resistors; Semiconductor device noise; Thermal resistance; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Bipolar Circuits and Technology Meeting, 1989., Proceedings of the 1989

Conference_Location

Minneapolis, MN

Type

conf

DOI

10.1109/BIPOL.1989.69469

Filename

69469