The influence of skewed populations on statistical and neural network control charts for process mean

Author

Ong, Hong Choon ; Ooi, Yew Jin

Author_Institution

Sch. of Math. Sci., Univ. Sains Malaysia, Minden, Malaysia

Volume

1

fYear

2010

fDate

26-28 Feb. 2010

Firstpage

197

Lastpage

201

Abstract

Control charts are important tools for detecting the presence of special cause in the process and are widely used in manufacturing. It is known that neural network control charts can detect smaller shifts in the process mean better than statistical control charts. In this study, the average run length of various control charts are compared using gamma distribution generated data with various skewness to measure the robustness. From the results obtained, the neural network based control chart is found to be less robust compared to the statistical based control charts which includes Shewhart XÂ¿ control chart, EWMA and CUSUM based control charts. Based on our results, we concluded that the EWMA control chart is the most robust.

Keywords

control charts; gamma distribution; neurocontrollers; statistical process control; CUSUM based control chart; EWMA based control chart; Shewhart X control chart; gamma distribution; neural network control charts; process mean; skewed populations influence; statistical control chart; Artificial neural networks; Control charts; Length measurement; Manufacturing processes; Neural networks; Neurons; Pattern recognition; Process control; Quality control; Robust control; average run length; control chart; neural network; skewed population;

fLanguage

English

Publisher

ieee

Conference_Titel

Computer and Automation Engineering (ICCAE), 2010 The 2nd International Conference on

Conference_Location

Singapore

Print_ISBN

978-1-4244-5585-0

Electronic_ISBN

978-1-4244-5586-7

Type

conf

DOI

10.1109/ICCAE.2010.5451970

Filename

5451970