• DocumentCode
    2170252
  • Title

    Stochastic analysis for crosstalk noise of coupled interconnects with process variations

  • Author

    Li, Xin ; Wang, Janet M. ; Tang, Weiqing ; Wu, Huizhong

  • Author_Institution
    Nanjing Univ. of Sci. & Technol., Nanjing
  • fYear
    2008
  • fDate
    2-4 June 2008
  • Firstpage
    289
  • Lastpage
    292
  • Abstract
    This paper proposes a new approach to analyze crosstalk of coupled interconnects in the presence of process variations. The suggested method translates correlated process variations into orthogonal random variables by principle component analysis (PCA). combined with polynomial chaos expression (PCE), the technique utilizes Stochastic Collocation Method (SCM) to analyze the system response of coupled interconnects. A finite representation of interconnect crosstalk is obtained by projecting the infinite series representation onto a finite dimensional subspace. Experimental results demonstrate that the approach match well with HSPICE. The differences between the crosstalk obtained from the analytical method and HSPICE is about 2% or less. Furthermore the new approach shows good computation efficiency: much less running time has been observed over Monte Carlo SPICE simulation.
  • Keywords
    crosstalk; integrated circuit interconnections; integrated circuit noise; principal component analysis; stochastic processes; HSPICE; coupled interconnects; crosstalk noise; finite dimensional subspace; infinite series representation; orthogonal random variables; polynomial chaos expression; principle component analysis; stochastic analysis; stochastic collocation method; Chaos; Computational modeling; Crosstalk; Monte Carlo methods; Polynomials; Principal component analysis; Random variables; SPICE; Stochastic resonance; Stochastic systems; crosstalk analysis; polynomial chaos expression; principle component analysis; process variations; stochastic collocation method;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Integrated Circuit Design and Technology and Tutorial, 2008. ICICDT 2008. IEEE International Conference on
  • Conference_Location
    Austin, TX
  • Print_ISBN
    978-1-4244-1810-7
  • Electronic_ISBN
    978-1-4244-1811-4
  • Type

    conf

  • DOI
    10.1109/ICICDT.2008.4567298
  • Filename
    4567298