• DocumentCode
    2170491
  • Title

    AFM analysis of wobble amplitude

  • Author

    Burkhead, David L. ; Chernoff, D.A.

  • Author_Institution
    Adv. Surface Microscopy Inc., Indianapolis, IN, USA
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    359
  • Lastpage
    361
  • Abstract
    We directly measure track wobble amplitude in recordable optical disc media using AFM images and automated analysis procedures. Wobble amplitude of 30 nm is easily measured, but calibration is important in order to avoid errors.
  • Keywords
    atomic force microscopy; optical disc storage; AFM imaging; automated analysis; calibration; optical disc; wobble amplitude; Atomic force microscopy; Calibration; Image analysis; Manufacturing; Optical microscopy; Optical recording; Size measurement; Spirals; Timing; Trajectory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Optical Memory and Optical Data Storage Topical Meeting, 2002. International Symposium on
  • Print_ISBN
    0-7803-7379-0
  • Type

    conf

  • DOI
    10.1109/OMODS.2002.1028667
  • Filename
    1028667
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2170491