DocumentCode
2170748
Title
[Title page i]
fYear
2010
fDate
1-4 Dec. 2010
Abstract
The following topics are dealt with: test generation and fault simulation; software testing and reliability model; failure analysis and fault modelling; build-in self-test or embedded testing; yield enhancement and silicon debug; automatic test equipment; analog and mixed signal testing and RF/High speed I/O testing; delay fault testing; low power testing; system-on-a-chip test and system-in-package test; memory and FPGA testing; board and system testing/ online testing; and test economics/ functional verification/ failure analysis.
Keywords
elemental semiconductors; fault simulation; field programmable gate arrays; functional analysis; program testing; reliability; silicon; system-on-chip; FPGA testing; RF-high speed I-O testing; analog signal testing; automatic test equipment; build-in self-test; delay fault testing; embedded testing; failure analysis; fault modelling; fault simulation; functional verification; low power testing; mixed signal testing; online testing; reliability model; silicon debug; software testing; system testing; system-in-package test; system-on-a-chip test; test economics; test generation; yield enhancement;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium (ATS), 2010 19th IEEE Asian
Conference_Location
Shanghai
ISSN
1081-7735
Print_ISBN
978-1-4244-8841-4
Type
conf
DOI
10.1109/ATS.2010.1
Filename
5692291
Link To Document