DocumentCode
2173469
Title
Graph partition by Swendsen-Wang cuts
Author
Barbu, Adrian ; Zhu, Songchun
Author_Institution
Dept. of Comput. Sci. & Stat., California Univ., Los Angeles, CA, USA
fYear
2003
fDate
13-16 Oct. 2003
Firstpage
320
Abstract
Vision tasks, such as segmentation, grouping, recognition, can be formulated as graph partition problems. The recent literature witnessed two popular graph cut algorithms: the Ncut using spectral graph analysis and the minimum-cut using the maximum flow algorithm. We present a third major approach by generalizing the Swendsen-Wang method - a well celebrated algorithm in statistical mechanics. Our algorithm simulates ergodic, reversible Markov chain jumps in the space of graph partitions to sample a posterior probability. At each step, the algorithm splits, merges, or regroups a sizable subgraph, and achieves fast mixing at low temperature enabling a fast annealing procedure. Experiments show it converges in 2-30 seconds on a PC for image segmentation. This is 400 times faster than the single-site update Gibbs sampler, and 20-40 times faster than the DDMCMC algorithm. The algorithm can optimize over the number of models and works for general forms of posterior probabilities, so it is more general than the existing graph cut approaches.
Keywords
Markov processes; computer vision; convergence; graph theory; image segmentation; probability; simulated annealing; statistical mechanics; Ncut algorithm; Swendsen-Wang method; annealing procedure; graph cut algorithms; graph partition problems; image segmentation; maximum flow algorithm; minimum-cut algorithm; posterior probability; reversible Markov chain jumps; single-site update Gibbs sampler; spectral graph analysis; statistical mechanics; vision tasks; Annealing; Bayesian methods; Clustering algorithms; Computational modeling; Computer vision; Image converters; Image segmentation; Partitioning algorithms; Spectral analysis; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Vision, 2003. Proceedings. Ninth IEEE International Conference on
Conference_Location
Nice, France
Print_ISBN
0-7695-1950-4
Type
conf
DOI
10.1109/ICCV.2003.1238362
Filename
1238362
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