• DocumentCode
    2173901
  • Title

    An efficient wire sweep analysis solution for practical applications

  • Author

    Francis Su ; Chen, Shou-Kang ; Su, H.H.

  • Author_Institution
    ChipMOS Technol. Inc., Tainan, Taiwan
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    1521
  • Lastpage
    1525
  • Abstract
    Wire sweep is one of the IC packaging defects that CAE tools have been applied for years by many researchers. Meanwhile, various methodologies have been introduced to get better prediction and matching to the experimental measurements. These studies mostly emphasized on the accuracy of the wire sweep calculation. The discussions about analysis efficiency, especially for the high pin-count package (100, 208 leads or more), are seldom touched. This study introduces a practical wire sweep analysis solution not only to meet the need of accuracy but also enhance the efficiency for actual applications. Coupling the design philosophy of these two needs, an in-house wire sweep analysis software (InPack) was developed. This software combines global flow analysis (C-MOLD) and structure analysis (ANSYS) to become a solution for general wire sweep evaluation. The wire geometry modeling procedure is neglected to improve the analytical efficiency. In addition, the multi-layer data requisition criteria is captured to simulate the actual flow conditions around a wire inside the mold cavity. With the Select (Input)-Execute-and-See user interface, the cycle time of wire sweep problem analysis is significantly reduced in practical application
  • Keywords
    inspection; integrated circuit packaging; ANSYS; C-MOLD; CAE; IC packaging defects; InPack; global flow analysis; software package; structure analysis; wire sweep analysis; Application software; Bonding; Drag; Encapsulation; Filling; Geometry; Graphics; Performance analysis; Solid modeling; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components & Technology Conference, 2000. 2000 Proceedings. 50th
  • Conference_Location
    Las Vegas, NV
  • Print_ISBN
    0-7803-5908-9
  • Type

    conf

  • DOI
    10.1109/ECTC.2000.853416
  • Filename
    853416