DocumentCode
2174539
Title
On the classical resolution limit of particle position measurement with optical tweezers
Author
Bowen, W.P. ; Tay, J.W. ; Jiang, X.
Author_Institution
Univ. of Otago, Dunedin
fYear
2007
fDate
17-22 June 2007
Firstpage
1
Lastpage
1
Abstract
Optical tweezers have many fundamental and commercial applications (Grier, 2003) ranging from trapping and transportation of cold atoms, to investigations of cellular structure and the properties of DNA. Many of these applications are enabled by the ability of optical tweezers to monitor the position of particles with sub-nanometre resolution. In applications such as nano-engineering and single particle diffusion studies, the particle position itself is the parameter of interest; whilst in other applications such as research into protein interactions, it is used to infer other parameters such as elasticity, or an applied force. The resolution of position measurement with classical optical fields is fundamentally limited by shotnoise due to quantization of the field, and by the specific design of the detection device while the inference of other parameters typically suffers a further limitation due to particle diffusion. Here we report on investigations of the combined classical resolution limit to particle position measurement imposed by the first two limitations.
Keywords
optical instruments; position measurement; radiation pressure; classical resolution limit; detection device limitation; optical tweezer; particle position measurement; shotnoise limitation; Atom optics; Atomic measurements; Charge carrier processes; DNA; Elasticity; Monitoring; Optical devices; Position measurement; Proteins; Transportation;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics, 2007 and the International Quantum Electronics Conference. CLEOE-IQEC 2007. European Conference on
Conference_Location
Munich
Print_ISBN
978-1-4244-0931-0
Electronic_ISBN
978-1-4244-0931-0
Type
conf
DOI
10.1109/CLEOE-IQEC.2007.4386927
Filename
4386927
Link To Document