A multi-pass A/D conversion technique for extracting on-chip analog signals

Author

Hajjar, Ara ; Roberts, Gordon W.

Author_Institution

Lab. of Microelectron. & Comput. Syst., McGill Univ., Montreal, Que., Canada

Volume

2

fYear

1998

fDate

31 May-3 Jun 1998

Firstpage

280

Abstract

A high speed and area-efficient A/D convertor is proposed for mixed-signal test applications. Only a single on-chip comparator is required to digitize repetitive analog waveforms. Simulations show 10 bits of amplitude resolution at 300 MHz for a bipolar comparator design (0.8 μm BiCMOS process), and 10 bits of amplitude resolution at 667 MHz for a CMOS comparator design (0.5 μm CMOS process)

Keywords

BiCMOS integrated circuits; CMOS integrated circuits; analogue-digital conversion; comparators (circuits); design for testability; integrated circuit testing; mixed analogue-digital integrated circuits; 0.5 micron; 0.8 micron; 300 MHz; 667 MHz; A/D conversion technique; BiCMOS process; CMOS comparator design; DFT; amplitude resolution; bipolar comparator design; high speed ADC; mixed-signal test applications; multi-pass ADC; onchip analog signals extraction; onchip comparator; repetitive analog waveforms; CMOS process; Circuit testing; Converters; Integrated circuit testing; Microelectronics; Mixed analog digital integrated circuits; Process design; Sampling methods; Signal resolution; Timing;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems, 1998. ISCAS '98. Proceedings of the 1998 IEEE International Symposium on

Conference_Location

Monterey, CA

Print_ISBN

0-7803-4455-3

Type

conf

DOI

10.1109/ISCAS.1998.706910

Filename

706910