Thermal resistance measurements of the surfaces of various materials in room temperature to 50 K

Author

Hasegawa, Yohei ; Takayama, S. ; Yamaguchi, Satarou

fYear

2001

fDate

2001

Firstpage

511

Lastpage

514

Abstract

Measurements of transport parameters of thermoelectric semiconductors need to control the temperature profile of the samples. Therefore, the appropriate materials should be employed for the sample-base and the electrodes in the different experiments. Similar problems occur when a thermoelectric element is set into an instrument. We measured the thermal resistances of the interfaces on various conditions from room temperature to 50 K. Furthermore, we separated the thermal resistances into two parts: those of the material itself and its pure interfaces

Keywords

interface phenomena; low-temperature techniques; semiconductors; surface phenomena; thermal conductivity measurement; thermal resistance; thermoelectricity; 20 C to 50 K; electrodes; interfaces; room temperature; surfaces; temperature profile; thermal resistance; thermal resistance measurements; thermoelectric element; thermoelectric semiconductors; transport parameters; Conducting materials; Copper; Electrical resistance measurement; Fiber reinforced plastics; Resistance heating; Surface resistance; Temperature; Thermal conductivity; Thermal resistance; Thermoelectricity;

fLanguage

English

Publisher

ieee

Conference_Titel

Thermoelectrics, 2001. Proceedings ICT 2001. XX International Conference on

Conference_Location

Beijing

ISSN

1094-2734

Print_ISBN

0-7803-7205-0

Type

conf

DOI

10.1109/ICT.2001.979943

Filename

979943