DocumentCode
2176805
Title
APD-based measurement technique to estimate the impact of noise emission from electrical appliances on digital communication systems
Author
Abidin, A. N Zainal ; Abdullah, W. R Wan ; Chuah, T.C. ; Jenu, M.Z.M. ; Ramli, A.
Author_Institution
EMC & Power Quality Program, TM Res.&Dev. Sdn. Bhd., Malaysia
fYear
2008
fDate
10-12 Dec. 2008
Firstpage
139
Lastpage
142
Abstract
This paper describes a technique to measure noise emissions from electrical appliances and study their impact towards digital communication systems by using the amplitude probability distribution (APD) methodology. The APD has been proposed within CISPR for measurement of electromagnetic noise emission. We present a measurement approach which utilizes a programmable digitizer with an analysis software to evaluate the noise APD pattern and probability density function (PDF). A unique noise APD pattern is obtained from each measurement of noise emission from different appliances. The noise PDF is useful for noise modeling and simulation, from which we can estimate the degradation on digital communication performance in terms of bit error probability (BEP). This technique provides a simple platform to examine the effect of other electrical appliances noise emission towards specific digital communication services.
Keywords
digital communication; domestic appliances; electrical products; electromagnetic interference; error statistics; noise; amplitude probability distribution methodology; analysis software; bit error probability; digital communication systems; electrical appliances; electromagnetic noise emission; probability density function; programmable digitizer; Density measurement; Digital communication; Electric variables measurement; Electrical products; Electromagnetic interference; Electromagnetic measurements; Measurement techniques; Noise level; Noise measurement; Probability distribution;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Packaging and Systems Symposium, 2008. EDAPS 2008. Electrical Design of
Conference_Location
Seoul
Print_ISBN
978-1-4244-2633-1
Electronic_ISBN
978-1-4244-2634-8
Type
conf
DOI
10.1109/EDAPS.2008.4736019
Filename
4736019
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