• DocumentCode
    2178015
  • Title

    Aligning Raw Image to Real-time Coordinate System

  • Author

    Bhatia, Gresha ; Rohira, Hitesh ; Mehta, Daishik ; Phatak, Aniket ; Gawde, Ameya

  • Author_Institution
    Dept. of Comput. Eng., VESIT, Mumbai, India
  • fYear
    2010
  • fDate
    9-10 Feb. 2010
  • Firstpage
    235
  • Lastpage
    239
  • Abstract
    Pattern matching is a technique in which the location of a particular place is found by comparing its raw image with the image present in the database. It is used to check the presence of certain structure in an image. It is done between the reference image and database images sequentially pixel by pixel. Today´s applications require more of georefrencing techniques like GIS and other geographic control framework. In this paper, we provide an overview of the prototype being developed for georefrencing for GIS using pattern recognition and data mining techniques. Our system utilizes various algorithms to reduce the impact of disturbances in images using affine and asymmetric transformations by considering the following assumptions: 1. Only spatial datasets from different sources are considered. 2. A minimum threshold resolution of images is required which is determined in advance. 3. We perform pattern matching on point data by using FFT algorithm.
  • Keywords
    fast Fourier transforms; geographic information systems; image matching; real-time systems; FFT algorithm; GIS; asymmetric transformations; data mining; database images; geographic control; georefrencing techniques; pattern matching; pattern recognition; real-time coordinate system; spatial datasets; threshold resolution; Data mining; Geographic Information Systems; Image databases; Image resolution; Pattern matching; Pattern recognition; Pixel; Prototypes; Real time systems; Spatial resolution; Affine; Asymmetric; GIS; Georefrencing; Registration; Segmentation; Spatial; Threshold;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Data Storage and Data Engineering (DSDE), 2010 International Conference on
  • Conference_Location
    Bangalore
  • Print_ISBN
    978-1-4244-5678-9
  • Type

    conf

  • DOI
    10.1109/DSDE.2010.21
  • Filename
    5452577