DocumentCode
2179498
Title
Coupled Analysis of Quasi-static and Full-Wave Solution towards IC, Package and Board Co-design
Author
Mao, Jifeng ; Fitzgerald, Greg ; Kuo, An-Yu ; Wane, Sidina
Author_Institution
Optimal Corp., San Jose, CA
fYear
2007
fDate
29-31 Oct. 2007
Firstpage
111
Lastpage
114
Abstract
In this paper, cascade-related approach and global one-single model methodology are investigated and compared in reference to real-world System-in-Package (SiP) product, which is designed using Cadence-SiP, and analyzed using Optimal SiP-enabled tool suite. A complete multi-level path, which consists of three portions-integrated circuit (IC), package and printed-circuit-board (PCB) -is selected as a test vehicle to investigate the limit of cascade-based approach. The results from quasi-static and full-wave simulation are compared, and the advantage of full-wave as well as limitation of quasi-static model are discussed. An innovative concept, referenced as "residual S-parameter", is proposed to characterize the coupling at the interface of IC, package and PCB, which plays an important role in the cascading of individual modules. Impact of the proposed concept on power integrity (PI) and signal integrity (SI) analysis is emphasized. Comparisons between full-wave, quasi-static and measurement results for representative component elements (interconnect, coupled bond wires) are discussed.
Keywords
printed circuit design; printed circuits; system-in-package; board codesign; cascade-related approach; full-wave solution; global one-single model methodology; integrated circuit; printed-circuit-board; quasistatic solution; real-world system-in-package product; residual S-parameter; signal integrity; Bonding; Circuit simulation; Circuit testing; Integrated circuit interconnections; Integrated circuit packaging; Integrated circuit testing; Product design; Scattering parameters; Signal analysis; Vehicles;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Performance of Electronic Packaging, 2007 IEEE
Conference_Location
Atlanta, GA
Print_ISBN
978-1-4244-0883-2
Type
conf
DOI
10.1109/EPEP.2007.4387137
Filename
4387137
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