A universal integrated circuit RF noise filtering capability measurement method

Generally, the measurement of radio frequency (RF) noise filtering capability is a necessary part in the design of integrated circuit productions. In this paper, the authors propose a universal integrated circuit RF noise filtering capability measurement method-RF anechoic chamber. During the test, we put the integrated circuit in anechoic chamber, which provides a controllable RF signal electrical level, standing for the interface intensity when the integrated circuit works. By measure the results from voltmeter, we get the RF noise filtering capability of the integrated circuit. This novel measurement method is useful for selecting IC method and helpful to get a suitable integrated circuit which could resist the RF noise.