• DocumentCode
    2182145
  • Title

    Design and optimization of redistribution layer (RDL) on TSV interposer for high frequency applications

  • Author

    Cui, Qinghu ; Sun, Xin ; Zhu, Yunhui ; Ma, Shenglin ; Chen, Jing ; Miao, Min ; Jin, Yufeng

  • Author_Institution
    Nat. Key Lab. of Sci. & Technol. on Micro/Nano Fabrication, Peking Univ., Beijing, China
  • fYear
    2011
  • fDate
    8-11 Aug. 2011
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    The fabrication of redistribution layer (RDL) for TSV 3D integration and its optimization are presented in this paper. BCB is selected as the passivation layer and the electroplated Cu is used as the metal layer. CYCLOTENE 3024-46 is utilized and it is deposited by spin-coating and soft cure at 210 °C in annealing oven for 40 minutes with N2 protection. Sputtered Ti/W/Cu and electron beam evaporated Ti/Cu on BCB have shown good adhesion. Daisy chain of the two metal layers and double layer of CPW are fabricated. The RDL of MSL and CPW are simulated by Ansoft HFSS. In condition of folded shape of RDL, multilayer of folded RDL gives the better performance than that of single layer and even has lower attenuation than straight line by optimization. Multilayer of RDL can also offset the insertion loss brought by TSV and has lower return loss. Multilayer of RDL with increasing width of metal line gradually from bottom to top is good for signal transmission and system reliability.
  • Keywords
    copper; electron beam deposition; electroplating; three-dimensional integrated circuits; BCB; Cu; TSV interposer; electron beam; electroplated copper; high frequency applications; passivation layer; redistribution layer; spin coating; Coplanar waveguides; Copper; Insertion loss; Nonhomogeneous media; Packaging; Through-silicon vias;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 2011 12th International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4577-1770-3
  • Electronic_ISBN
    978-1-4577-1768-0
  • Type

    conf

  • DOI
    10.1109/ICEPT.2011.6066788
  • Filename
    6066788