DocumentCode
2183357
Title
Modeling of a Rotational Spectrometer by Ray Tracing Methods
Author
Lacik, J. ; Lukes, Z. ; Raida, Z.
Author_Institution
Brno Univ. of Technol., Brno
fYear
2007
fDate
17-21 Sept. 2007
Firstpage
299
Lastpage
301
Abstract
In this paper the ray tracing method is developed and used for the modeling of a rotational spectrometer. Since the electrical size of the spectrometer is several thousands times longer compared to the wavelength, the presented approach is much suitable for the analysis of such huge devices than the classical numerical exact methods such as the fast integral methods.
Keywords
microwave devices; microwave spectrometers; ray tracing; ray tracing; rotational spectrometer modeling; Electromagnetic analysis; Electromagnetic diffraction; Electromagnetic wave absorption; Frequency; Microwave devices; Microwave theory and techniques; Polarization; Ray tracing; Space technology; Spectroscopy;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetics in Advanced Applications, 2007. ICEAA 2007. International Conference on
Conference_Location
Torino
Print_ISBN
978-1-4244-0767-5
Electronic_ISBN
978-1-4244-0767-5
Type
conf
DOI
10.1109/ICEAA.2007.4387297
Filename
4387297
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