• DocumentCode
    2183976
  • Title

    A full-factory simulator as a daily decision-support tool for 300MM wafer fabrication productivity

  • Author

    Bagchi, Sugato ; Chen-Ritzo, Ching-Hua ; Shikalgar, Sameer T. ; Toner, Michael

  • Author_Institution
    Bus. Analytics & Math. Sci., I.B.M. T. J. Watson Res. Center, Yorktown Heights, NY, USA
  • fYear
    2008
  • fDate
    7-10 Dec. 2008
  • Firstpage
    2021
  • Lastpage
    2029
  • Abstract
    We describe a discrete event simulator developed for daily prediction of WIP position in an operational 300 mm wafer fabrication factory to support tactical decision-making. The simulator is distinctive in that its intended prediction horizon is relatively short, on the order of a few days, while its modeling scope is relatively large. The simulation includes over 90% of the wafers being processed in the fab and all process, measurement and testing tools. The model parameters are automatically updated using statistical analyses performed on the historical event logs generated by the factory. This paper describes the simulation model and the parameter estimation methods. A key requirement to support daily and weekly decision-making is good validation results of the simulation against actual fab performance. Therefore, we also present validation results that compare simulated production metrics against those obtained from the actual fab, for fab-wide, process, tool and product specific metrics.
  • Keywords
    decision support systems; discrete event simulation; electronic engineering computing; statistical analysis; wafer level packaging; daily decision-support tool; discrete event simulator; full-factory simulator; intended prediction horizon; parameter estimation methods; statistical analyses; tactical decision-making; wafer fabrication productivity; Decision making; Discrete event simulation; Fabrication; Parameter estimation; Predictive models; Production facilities; Productivity; Semiconductor device modeling; Statistical analysis; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Simulation Conference, 2008. WSC 2008. Winter
  • Conference_Location
    Austin, TX
  • Print_ISBN
    978-1-4244-2707-9
  • Electronic_ISBN
    978-1-4244-2708-6
  • Type

    conf

  • DOI
    10.1109/WSC.2008.4736297
  • Filename
    4736297