• DocumentCode
    2184465
  • Title

    Rough interface reconstruction using the level set method

  • Author

    Kim, Yootai ; Machiraju, Raghu ; Thompson, David

  • Author_Institution
    Ohio State Univ., Columbus, OH, USA
  • fYear
    2004
  • fDate
    10-15 Oct. 2004
  • Firstpage
    251
  • Lastpage
    258
  • Abstract
    We present a new level set method for reconstructing interfaces from point aggregations. Although level-set-based methods are advantageous because they can handle complicated topologies and noisy data, most tend to smooth the inherent roughness of the original data. Our objective is to enhance the quality of a reconstructed surface by preserving certain roughness-related characteristics of the original dataset. Our formulation employs the total variation of the surface as a roughness measure. The algorithm consists of two steps: a roughness-capturing flow and a roughness-preserving flow. The roughness capturing step attempts to construct a surface for which the original roughness is captured - distance flow is well suited for roughness capturing. Surface reconstruction is enhanced by using a total variation preserving (TVP) scheme for the roughness-preserving flow. The shock filter formulation of Osher and Rudin is exploited to achieve this goal. In practice, we have found that better results arc obtained by balancing the TVP term with a smoothing term based on curvature. The algorithm is applied to both fractal surface growth simulations and scanned data sets to demonstrate the efficacy of our approach.
  • Keywords
    aggregation; interface roughness; mesh generation; surface fitting; surface reconstruction; level set method; point sampled data; rough interface reconstruction; shock filter formulation; surface reconstruction; total variation preserving; Electric shock; Filters; Fractals; Level set; Noise level; Rough surfaces; Smoothing methods; Surface reconstruction; Surface roughness; Topology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Visualization, 2004. IEEE
  • Print_ISBN
    0-7803-8788-0
  • Type

    conf

  • DOI
    10.1109/VISUAL.2004.94
  • Filename
    1372204