• DocumentCode
    2184517
  • Title

    Space weather effects on technological systems on the ground

  • Author

    Pirjola, Risto

  • Author_Institution
    Dept. of Geophys. Res., Finnish Meteorol. Inst., Helsinki, Finland
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    217
  • Lastpage
    221
  • Abstract
    Space weather refers to conditions in the Earth´s near-space associated with particles and electromagnetic fields which may influence the operation of space-borne and ground-based technological systems. At the Earth´s surface space weather manifests itself as geomagnetic storms and its effects are known as GIC (geomagnetically induced currents). Power grids and pipelines are systems experiencing GIC. In the former, transformers can be saturated leading to different problems, and in the latter problems associated with corrosion arise. GIC are driven by the geoelectric field induced by a magnetic storm. The complex image method (CIM) has been proved to be an efficient tool for calculating the geoelectric field. The basic principles of CIM are presented in this paper. Regarding the flow of GIC, a discretely earthed power system and a continuously earthed buried pipeline represent two extreme cases requiring different methods for determining GIC
  • Keywords
    earthing; electromagnetic induction; magnetic storms; power systems; power transformers; terrestrial electricity; Earth near-space; complex image method; continuously earthed buried pipeline; corrosion; discretely earthed power system; electromagnetic fields; geoelectric field; geomagnetic storms; geomagnetically induced currents; pipelines; power grids; space weather effects; technological systems; transformers saturation; Computer integrated manufacturing; Corrosion; Earth; Electromagnetic fields; Geomagnetism; Pipelines; Power grids; Space technology; Storms; Transformers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Environmental Electromagnetics, 2000. CEEM 2000. Proceedings. Asia-Pacific Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    7-5635-0420-6
  • Type

    conf

  • DOI
    10.1109/CEEM.2000.853936
  • Filename
    853936