DocumentCode
2187377
Title
Power stabilised exceptionally high stability cryogenic sapphire resonator oscillator
Author
Luiten, A.N. ; Mann, A.G. ; Blair, D.G.
Author_Institution
Dept. of Phys., Western Australia Univ., Nedlands, WA, Australia
fYear
1994
fDate
June 27 1994-July 1 1994
Firstpage
152
Lastpage
153
Abstract
Power stabilized microwave oscillators of exceptional short term stability have been realized from cryogenic sapphire resonators with loaded Q-factors of 10/sup 9/ at X-band and 6 K. These oscillators have exhibited a fractional frequency stability of 3-4/spl times/10/sup -15/ for integration times from 0.3 to 100 seconds degrading to 10/sup -14/ at 1000 seconds.<>
Keywords
dielectric resonators; frequency stability; microwave generation; microwave oscillators; sapphire; 0.3 to 100 s; 1000 s; 6 K; Al/sub 2/O/sub 3/; X-band; cryogenic sapphire resonator oscillator; cryogenic sapphire resonators; fractional frequency stability; frequency standard; loaded Q-factors; power stabilized microwave oscillators; short term stability; Atomic clocks; Circuit stability; Cryogenics; Degradation; Frequency synthesizers; Microwave oscillators; Physics; Q factor; Radiation detectors; Temperature dependence;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements, 1994. Digest., 1994 Conference on
Conference_Location
Boulder, CO, USA
Print_ISBN
0-7803-1984-2
Type
conf
DOI
10.1109/CPEM.1994.333406
Filename
333406
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