• DocumentCode
    2191516
  • Title

    Performance of the TPC with micro pixel chamber readout: micro-TPC

  • Author

    Miuchi, Kentaro ; Kubo, Hidetoshi ; Nagayoshi, Tsutomu ; Ochi, Atsuhiko ; Orito, Reiko ; Takada, Atsushi ; Tanimori, Toru ; Ueno, Masaru

  • Author_Institution
    Dept. of Phys., Kyoto Univ., Japan
  • Volume
    1
  • fYear
    2002
  • fDate
    10-16 Nov. 2002
  • Firstpage
    297
  • Abstract
    Micro-TPC, a time projection chamber (TPC) with micro pixel chamber (μ-PIC) readout was developed for the detection of the three dimensional fine (∼sub-millimeter) tracks of charged particles. We have developed a two-dimensional position sensitive gaseous detector, or the μ-PIC, with the detection area of 10 × 10 cm2 and 65536 anode electrodes of 400 μm pitch. We achieved the gas gain of over ×104 without any other multipliers. With the pipe-line readout system developed for the μ-PIC, we detected high intersity X-rays at the rate as high as 7.7Mcps. The TPC has the drift length of 8 cm and the uniform electric field of 0.4 kV/cm. We tested the performance of the micro-TPC and we took the three-dimensional tracks of the electrons. We also developed a prototype of the MeV Gamma-ray imaging detector which is a hybrid of the micro-TPC with NaI(Tl) scintillators and we have confirmed its concept by showing the reconstructed gamma-ray event.
  • Keywords
    X-ray detection; gamma-ray detection; nuclear electronics; readout electronics; time projection chambers; 2D position sensitive gaseous detector; Gas Electron Multiplier; MeV gamma-ray imaging detector; electron multiplication; high intersity X-rays; micro pixel chamber readout; micro-pattern detector; microTPCs; multi-GEM structure; pipe-line readout system; time projection chamber; Anodes; Electrodes; Electrons; Nuclear imaging; Particle tracking; Position sensitive particle detectors; Prototypes; Testing; X-ray detection; X-ray detectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2002 IEEE
  • Print_ISBN
    0-7803-7636-6
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2002.1239320
  • Filename
    1239320