DocumentCode
2191544
Title
Hierarchical symbolic piecewise-linear circuit analysis
Author
Yang, Junjie ; Tan, Sheldon X D ; Qi, Zhenyu ; Gawecki, Martin
Author_Institution
Dept. of Electr. Eng., California Univ., Riverside, CA, USA
fYear
2005
fDate
22-23 Sept. 2005
Firstpage
140
Lastpage
145
Abstract
This paper presents a hierarchical transient analysis method for piecewise-linear (PWL) circuits suitable for early stage verification of analog and mixed-signal circuits. The new method is based on a novel parameterized modeling of PWL devices, which results in very compact circuit matrices compared to existing PWL simulation algorithms based on ideal diode models. The new PWL symbolic analysis features exact symbolic solution of linear systems via graph based hierarchical analysis technique and PWL modeling of nonlinear devices. The resulting parameterized PWL circuit equations are solved by a modified Katzenelson event-driven algorithm to obtain transient responses for all subcircuits based on the symbolic solutions. Since PWL components are modeled symbolically in the new method, symbolic solutions are built only once and used repeatedly throughout the entire simulation, which makes the new PWL simulation algorithm more efficient than the Newton-Raphson (NR) based numerical methods, which require solving of linear equations (LU decomposition) at every step in NR iterations. Experimental results on a number of analog circuits show that the proposed hierarchical method outperforms the commercial simulator, SIMetrix and the flat PWL simulator.
Keywords
circuit simulation; transient analysis; Katzenelson event-driven algorithm; Newton-Raphson method; analog circuit; hierarchical transient analysis; mixed-signal circuit; piecewise-linear circuit analysis; symbolic analysis; Analytical models; Circuit analysis; Circuit simulation; Diodes; Equations; Nonlinear circuits; Piecewise linear techniques; Planets; Sparse matrices; Transient analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Behavioral Modeling and Simulation Workshop, 2005. BMAS 2005. Proceedings of the 2005 IEEE International
Print_ISBN
0-7803-9352-X
Type
conf
DOI
10.1109/BMAS.2005.1518202
Filename
1518202
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