DocumentCode
2191661
Title
Amplitude and time measurement ASIC with analog derandomization
Author
Connor, Paul O. ; De Geronimo, Gianluigi ; Kandasamy, Anand
Author_Institution
Brookhaven Nat. Lab., Upton, NY, USA
Volume
1
fYear
2002
fDate
10-16 Nov. 2002
Firstpage
327
Abstract
We describe a new ASIC for accurate and efficient processing of high-rate pulse signals from highly segmented detectors. In contrast to conventional approaches, this circuit affords a dramatic reduction in data volume through the use of analog techniques (precision peak detectors and time-to-amplitude converters) together with fast arbitration and sequencing logic to concentrate the data before digitization. In operation the circuit functions like a data-driven analog first-in, first-out (FIFO) memory between the preamplifiers and the ADC. Peak amplitudes of pulses arriving at any one of the 32 inputs are sampled, stored, and queued for readout and digitization through a single output port. Hit timing, pulse risetime, and channel address are also available at the output. Prototype chips have been fabricated in 0.35 micron CMOS and tested. First results indicate proper functionality for pulses down to 30 ns peaking time and input rates up to 1.6 MHz/channel. Amplitude accuracy of the peak detect and hold circuit is 0.3% (absolute). TAC accuracy is within 0.3% of full scale. Power consumption is less than 2 mW/channel. Compared with conventional techniques such as track-and-hold and analog memory, this new ASIC will enable efficient pulse height measurement at 20 to 300 times higher rates.
Keywords
CMOS analogue integrated circuits; application specific integrated circuits; convertors; peak detectors; pulse height analysers; readout electronics; time measurement; 0.35 micron; ADC; CMOS ASIC; FIFO memory; amplitude measurement; analog derandomization; arbitration logic; peak detect-and-hold circuit; peak detector; preamplifier; pulse height measurement; pulse signal processing; readout electronics; segmented detector; sequencing logic; time measurement; time-to-amplitude converter; Application specific integrated circuits; Circuit testing; Detectors; Logic circuits; Preamplifiers; Prototypes; Pulse measurements; Signal processing; Time measurement; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record, 2002 IEEE
Print_ISBN
0-7803-7636-6
Type
conf
DOI
10.1109/NSSMIC.2002.1239326
Filename
1239326
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