• DocumentCode
    2191743
  • Title

    Power constrained preemptive TAM scheduling

  • Author

    Larsson, Erik ; Fujiwara, Hideo

  • Author_Institution
    Graduate Sch. of Inf. Sci., Nara Inst. of Sci. & Technol., Japan
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    119
  • Lastpage
    126
  • Abstract
    We integrate scan-chain partitioning and preemptive test access mechanism (TAM) scheduling for core-based systems under power constraint. We also outline a flexible power conscious test wrapper to increase the flexibility in the scheduling process by (1) allowing several different bandwidths at cores and (2) controlling the cores test power consumption, which makes it possible to increase the test clock. We model the scheduling problem as a bin-packing problem and discuss the transformations: (1) TAM-time and (2) power-time and the possibilities of achieving an optimal solution and the limitations. We have implemented our proposed preemptive TAM scheduling algorithm and through experiments we demonstrate its efficiency.
  • Keywords
    VLSI; bin packing; built-in self test; integrated circuit testing; logic testing; scheduling; system-on-chip; bin-packing problem; core-based systems; flexible power conscious test wrapper; power constrained preemptive TAM scheduling; preemptive test access mechanism scheduling; scan-chain partitioning; test clock; test power consumption; Automatic testing; Bandwidth; Built-in self-test; Circuit testing; Clocks; Control systems; Information science; Power system modeling; Scheduling; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Workshop, 2002. Proceedings. The Seventh IEEE European
  • ISSN
    1530-1877
  • Print_ISBN
    0-7695-1715-3
  • Type

    conf

  • DOI
    10.1109/ETW.2002.1029648
  • Filename
    1029648