• DocumentCode
    2191901
  • Title

    A Practical Low Limit on Energy Spent on Processing of One Bit of Data

  • Author

    Izydorczyk, Jacek ; Cionaka, Ludwig

  • Author_Institution
    Silesian Univ. of Technol., Gliwice
  • fYear
    2008
  • fDate
    8-11 July 2008
  • Firstpage
    509
  • Lastpage
    514
  • Abstract
    The semiconductor industry is very reluctant to revolutionary changes in proven technologies they use. That is why we can expect a long life of CMOS technology. The author tries to answer a question: "Howlong contemporary technology can be improved and scaled down to smaller dimensions?" Considerations are based on Information Theory. Instead of number of integrated devices number of processed, uncoded data per square centimeter per second was suggested as a measure of integrated circuit complexity. A model of logic gate was proposed based on additive white gaussian noise channel. From the model it is evident that we are in transition from band-limited regime of hardware operation to power-limited regime. Power limited regime is characterized by massive appearance of thermal noise hardware malfunctions. Shannon theory promise that it is not a sign of thermal noise death of the technology but a new stage when reliable systems are constructed from unreliable logic gates.
  • Keywords
    AWGN channels; CMOS integrated circuits; circuit complexity; information theory; integrated circuit reliability; logic gates; thermal noise; CMOS technology; Shannon theory; additive white Gaussian noise channel; information theory; integrated circuit complexity; integrated devices; logic gate; power limited regime; semiconductor industry; thermal noise hardware malfunctions; CMOS technology; Gaussian channel; Moores law;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer and Information Technology Workshops, 2008. CIT Workshops 2008. IEEE 8th International Conference on
  • Conference_Location
    Sydney, QLD
  • Print_ISBN
    978-0-7695-3242-4
  • Electronic_ISBN
    978-0-7695-3239-1
  • Type

    conf

  • DOI
    10.1109/CIT.2008.Workshops.21
  • Filename
    4568555