• DocumentCode
    2192312
  • Title

    Efficient integrated DC-DC power converters - Advanced technologies and new challenges

  • Author

    Shenai, K. ; Bernstein, Gary H. ; Wu, J.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Univ. of Toledo, Toledo, OH, USA
  • fYear
    2011
  • fDate
    25-26 May 2011
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Advanced circuit component, packaging, and thermal management technologies are critically evaluated for developing efficient integrated DC-DC power converters; and, important challenges and potential limitations are identified. It is shown that heterogeneous chip-scale integration of GaN power FETs, silicon CMOS control, integrated power inductors, and microchip capacitors using the new high-density, low-loss Quilt Packaging™ (QP) promises efficiency performance breakthroughs never seen before with integrated silicon DC-DC power converter chips. Thermal constraints arising from the heating of GaN power FETs and integrated chip-scale power inductors not only require advanced cooling, but also will ultimately limit the scalability, performance, and reliability of this important emerging technology.
  • Keywords
    CMOS integrated circuits; DC-DC power convertors; III-V semiconductors; capacitors; gallium compounds; power MOSFET; power field effect transistors; silicon; thermal management (packaging); wide band gap semiconductors; GaN; advanced circuit component; chip-scale power inductors; integrated DC-DC power converters; integrated power inductors; low-loss quilt packaging; microchip capacitors; power FET; silicon CMOS control; thermal management technology; CMOS integrated circuits; Gallium nitride; ISO standards; Insulation; Magnetic flux; Skin; Switches; “Quilt” packaging; DC-DC converter; efficiency; gallium nitride; microchip capacitor; power FET; power inductor; reliability; silicon CMOS; thermal management;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Energytech, 2011 IEEE
  • Conference_Location
    Cleveland, OH
  • Print_ISBN
    978-1-4577-0777-3
  • Electronic_ISBN
    978-1-4577-0775-9
  • Type

    conf

  • DOI
    10.1109/EnergyTech.2011.5948531
  • Filename
    5948531