DocumentCode
2193220
Title
Accuracy of bipolar compact models under RF power operating conditions
Author
Versleijen, M.P.J.G. ; Bauvin, A.
Author_Institution
Philips Res. Lab., Eindhoven, Netherlands
fYear
1994
fDate
23-27 May 1994
Firstpage
1583
Abstract
The large-signal accuracy of the SPICE Gummel-Poon and MEXTRAM bipolar compact models for circuit simulation is assessed by means of comparison with 2D large-signal mixed-mode device/circuit simulations under realistic RF power operating conditions. This verification approach eliminates measurement uncertainties and thus concentrates on the intrinsic model behavior. The overall accuracy of both models is found to be quite good. MEXTRAM is more accurate, especially at high-excitation levels.<>
Keywords
SPICE; bipolar transistors; circuit analysis computing; semiconductor device models; 2D large-signal mixed-mode device; Gummel-Poon model; MEXTRAM model; RF power; SPICE; bipolar compact models; circuit simulation; high-excitation levels; verification; Circuit simulation; Measurement uncertainty; Radio frequency; SPICE;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 1994., IEEE MTT-S International
Conference_Location
San Diego, CA, USA
ISSN
0149-645X
Print_ISBN
0-7803-1778-5
Type
conf
DOI
10.1109/MWSYM.1994.335271
Filename
335271
Link To Document