DocumentCode
2193391
Title
Using the excitation surface plasma waves of Kretschmann configuration to the normal saline measurement
Author
Lee, Cheng-Min ; Chang, Chia-Hao ; Liu, Shun-Wen ; Chou, Pei-Wen ; Jheng, Yu-Si ; Wu, Tian-Fu ; Lan, Jyun-Ming ; Wu, Hung-Tze
Author_Institution
Dept. of Electron. Eng., Ching Yun Univ., Jhongli, Taiwan
fYear
2011
fDate
9-11 Sept. 2011
Firstpage
4062
Lastpage
4064
Abstract
This study is using Optical Frustrated Total Internal Reflection method and Kretschmann configuration to excite surface plasma waves . When the Surface Plasma Wave measurement system to reaction of normal saline, We can find the corresponding point of the surface plasmon resonance and absorption depth and bandwidth.
Keywords
organic compounds; plasma waves; reflectivity; surface plasmon resonance; Kretschmann configuration; absorption bandwidth; absorption depth; excitation surface plasma waves; normal saline measurement; optical frustrated total internal reflection method; surface plasmon resonance; Films; Metals; Optical reflection; Optical surface waves; Plasma waves; Surface waves; Kretschmann configuration; Optical Frustrated Total Internal Reflection method; Saline; Surface Plasma Waves(SPW);
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics, Communications and Control (ICECC), 2011 International Conference on
Conference_Location
Ningbo
Print_ISBN
978-1-4577-0320-1
Type
conf
DOI
10.1109/ICECC.2011.6067634
Filename
6067634
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