• DocumentCode
    2194286
  • Title

    A class of radiationless wideband coplanar waveguide open stubs for monolithic and hybrid integrated circuits

  • Author

    Wu, K. ; Sadat, R. ; Klemer, D. ; Bosisio, R.G.

  • Author_Institution
    Dept. de Genie Electrique et de Genie Inf., Ecole Polytech., Montreal, Que., Canada
  • fYear
    1994
  • fDate
    23-27 May 1994
  • Firstpage
    277
  • Abstract
    A class of wideband coplanar waveguide open stubs is proposed for applications in passive and active monolithic and hybrid microwave integrated circuits. The novel stubs feature radiationless characteristics based on convergent anti-symmetrical electric fields of the CPW fundamental mode along a circular aperture. A space-spectral domain approach is used to accurately determine characteristics of the proposed CPW open stubs. The effect of conductor losses is assessed by a 2D self-consistent analysis using the method of lines. It is found that radiation losses and wideband performance can be improved simultaneously by appropriately compensating the central conductor of the CPW. The proposed CPW open stubs are fabricated using a GaAs MMIC process. It is shown that the theory and accurate on-wafer measurement have excellent agreement.<>
  • Keywords
    MMIC; hybrid integrated circuits; losses; microstrip components; microwave integrated circuits; 2D self-consistent analysis; CPW fundamental mode; CPW open stubs; GaAs MMIC process; circular aperture; conductor losses; convergent anti-symmetrical electric fields; hybrid integrated circuits; method of lines; monolithic integrated circuits; radiation losses; radiationless wideband CPW type; space-spectral domain approach; wideband performance; Apertures; Application specific integrated circuits; Conductors; Coplanar waveguides; Hybrid integrated circuits; MMICs; Microwave integrated circuits; Monolithic integrated circuits; Performance loss; Wideband;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 1994., IEEE MTT-S International
  • Conference_Location
    San Diego, CA, USA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-1778-5
  • Type

    conf

  • DOI
    10.1109/MWSYM.1994.335317
  • Filename
    335317