DocumentCode
2196651
Title
Triclinic crystal structure of [(Bi1-x Cox )2 (Sr1-y Biy )2 O4+δ ]p [CoO2 ]2 with p∼1.05 and δ∼0.7
Author
Kajitani, T. ; Begum, S. ; Yubuta, K. ; Miyazaki, Y. ; Igawa, N.
Author_Institution
Dept. of Appl. Phys., Tohoku Univ., Sendai
fYear
2007
fDate
3-7 June 2007
Firstpage
108
Lastpage
111
Abstract
Bi-Sr-Co-O oxide semiconductor system has a typical misfit-layered crystal structure and a promising thermoelectric property. There are two different kinds of electron diffraction patterns taken with the electron beam parallel to the c-axis. Monoclinic unit cell was defined for the system having the metal ratio close to Bi:Sr:Co~1:1:1 by Leligny et al.1) The metal ratio of the present crystal is Bi:Sr:Co~1:0.8:1.1, being Co-rich and Sr-poor. The ratio was determined using an electron probe microanalyer. Oxygen content was determined by the inert gas-carrier fusion-infrared absorption method. Triclinic unit cell is determined by means of the whole pattern fitting technique, i.e., the Le Bail decomposition method, based on the neutron and X-ray power diffraction patterns, using a powder diffraction pattern fitting program Jana2000.2) There are chemical content dependent changes in the structural parameters. The lattice parameters are typically a,b1(RS),b2(CoO2),c,alpha,beta,gamma =4.94 Aring, 5.26 Aring, 5.45 Aring, 15.21 Aring, 90.2deg, 93.8deg, 89.3deg, respectively.
Keywords
X-ray diffraction; adsorption; bismuth compounds; cobalt compounds; crystal structure; electron diffraction; lattice constants; neutron diffraction; (BiCo)2(SrBi)2O4(CoO2)2; Le Bail decomposition; X-ray power diffraction; electron diffraction; electron probe microanalyer; inert gas-carrier fusion-infrared absorption; lattice parameters; misfit-layered crystal structure; monoclinic unit cell; neutron diffraction; oxide semiconductor system; structural parameters; thermoelectric property; triclinic crystal structure; whole pattern fitting technique; Bismuth; Chemicals; Electromagnetic wave absorption; Electron beams; Neutrons; Oxygen; Powders; Probes; Thermoelectricity; X-ray diffraction;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermoelectrics, 2007. ICT 2007. 26th International Conference on
Conference_Location
Jeju Island
ISSN
1094-2734
Print_ISBN
978-1-4244-2262-3
Electronic_ISBN
1094-2734
Type
conf
DOI
10.1109/ICT.2007.4569435
Filename
4569435
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