Low pressure breakdown in microwave devices using particle-in-cell simulations

In particular, there are two situations where a low pressure breakdown in microwave devices can happens during the satellite lifetime: launching and returning. In order to increase the reliability of the TTC, and save the cost of design of the microwave devices considering the gas breakdown in low pressure, a three dimensionOal particle-in-cell (PIC) simulations are conducted to measure the power-handing capability of arbitrary complex components based on coaxial waveguide. New cut-cell emission and absorption boundary algorithms implemented in the electromagnetic PIC code, VORPAL are utilized for this study.