DocumentCode
2197459
Title
A Test and Diagnosis Methodology for RF Transceivers
Author
Chen, Hung-Kai ; Su, Chauchin
Author_Institution
Nat. Chiao Tung Univ., Hsinchu
fYear
2007
fDate
8-11 Oct. 2007
Firstpage
135
Lastpage
138
Abstract
This paper proposes an RF test and diagnosis methodology based on digital DFT structure and built- in DSP function of a SoC Chip. Constellation variation plots are proposed to identify the faulty component. Furthermore, linear interpolation is used to determine the amount of variation. The simulated test results show that the method is able to identify not only the faulty component but also the variation amount precise.
Keywords
digital signal processing chips; fault diagnosis; system-on-chip; transceivers; DSP function; RF transceivers; SoC chip; diagnosis methodology; digital DFT structure; linear interpolation; Circuit faults; Circuit testing; Costs; Digital signal processing; Fault diagnosis; Interpolation; RF signals; Radio frequency; Radiofrequency identification; Transceivers;
fLanguage
English
Publisher
ieee
Conference_Titel
Asian Test Symposium, 2007. ATS '07. 16th
Conference_Location
Beijing
ISSN
1081-7735
Print_ISBN
978-0-7695-2890-8
Type
conf
DOI
10.1109/ATS.2007.29
Filename
4387998
Link To Document