DocumentCode
2197649
Title
Next Generation Test, Diagnostics and Yield Challenges for EDA, ATE, IP and Fab - A Perspective from All Sides
Author
Kohiyama, Yasuharu ; Ravikumar, C. ; Sato, Yasuo ; Wang, Laung-Terng ; Zorian, Yervant
Author_Institution
Advantest, Japan
fYear
2007
fDate
8-11 Oct. 2007
Firstpage
207
Lastpage
207
Abstract
The Test industry has come a long way over the past few decades. As a whole we have made great strides in the areas of:
Keywords
Automatic test pattern generation; Built-in self-test; Clocks; Costs; Electronic design automation and methodology; Instruments; Logic testing; Pressing; System testing; Test equipment;
fLanguage
English
Publisher
ieee
Conference_Titel
Asian Test Symposium, 2007. ATS '07. 16th
Conference_Location
Beijing, China
ISSN
1081-7735
Print_ISBN
978-0-7695-2890-8
Type
conf
DOI
10.1109/ATS.2007.111
Filename
4388010
Link To Document