DocumentCode
2197659
Title
Effect of high efficiency lighting on power quality in public buildings
Author
Melhorn, C.J. ; Schwabe, R.J. ; Samotyj, M.
Author_Institution
Electrotek Concepts Inc., Knoxville, TN, USA
Volume
3
fYear
1995
fDate
8-12 Oct 1995
Firstpage
2069
Abstract
The New York Power Authority (NYPA) is implementing a High Efficiency Lighting Program (HELP) in schools and public buildings within the State of New York. HELP focuses on the replacement of magnetic ballast fluorescent light fixtures with the new high efficiency electronic ballast fixtures. The use of electronic ballast can have an adverse effect on power quality. To determine the effects that the electronic ballasts have on the power quality of the buildings being retrofitted, studies are being performed at three buildings scheduled for the retrofit program. Power quality measurements throughout the buildings are being made before, during, and after the lighting retrofits. The results will be analyzed and simulations performed to identify and predict power quality problems that might occur with these and future retrofits. The effect of electronic ballasts on sensitive electronic devices is under investigation. Electronic ballasts are attributed with causing interference in a hearing aid worn by a student in an elementary school and interference with a book detector in a library. The effects are being studied to determine and understand the mechanism and recommend solutions to rectify the problems
Keywords
electromagnetic interference; fluorescent lamps; lamp accessories; lighting; power measurement; power supply quality; power system harmonics; power system measurement; High Efficiency Lighting Program; New York Power Authority; electronic ballast; hearing aid interference; library book detector interference; lighting retrofits; power quality; power quality measurements; public buildings; Analytical models; Educational institutions; Electronic ballasts; Fixtures; Fluorescence; Interference; Performance analysis; Power measurement; Power quality; Predictive models;
fLanguage
English
Publisher
ieee
Conference_Titel
Industry Applications Conference, 1995. Thirtieth IAS Annual Meeting, IAS '95., Conference Record of the 1995 IEEE
Conference_Location
Orlando, FL
ISSN
0197-2618
Print_ISBN
0-7803-3008-0
Type
conf
DOI
10.1109/IAS.1995.530566
Filename
530566
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